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Microstructural and diffusional aspects of the growth of alumina scales on fi-NiA1

Time:2013-04-07 09:02:33  From:Materials Science and Engineering  Author:J. Balmain, M.K. Loudjani, A.M

Abstract
The transport properties of alumina scales formed on undoped and Y-doped fl-NiAi have been characterized at 1100°C by diffusion measurements, either by isotopic exchange (t60,_-~802) or from a thin film of chromium, in order to simulate the cationic inward  diffusion. The penetration profiles have been established by secondary ion mass spectrometry (SIMS). To determine anionic and cationic diffusion coefficients, the microstructure, determined by transmission electron microscopy (TEM), and the surface roughness of the scale have been considered. The diffusion coefficients determined on scales are compared to results on massive alumina extrapolated to  1100°C. The oxidation constant is then calculated, using the theory of Wagner, and compared either with the values experimentally obtained by thermogravimetry, or with the oxidation constant calculated from electrochemical measurements. The value calculated from the electrochemical results is in good agreement with the experimental value, while the calculation from diffusion data leads to an oxidation constant smaller than the experimental value. The yttrium effect on transport properties is small.  © 1997 Elsevier Science S.A.
Key~vords: Aiumina scale; Diffusion; Microstructure; NiA1; Oxidation constant; Yttrium-doping

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