The GEZ/YSZ TBCs have been deposited by EB-PVD technology. The GEZ/YSZ TBCs exhibit a defect fluorite structure. The TEC of GEZ ceramics is much higher than that of GZ ceramics above 1150 ◦C. The thermal conductivity of GEZ ceramic material is 0.95 W/mK at 1000 ◦C and 1.02 W/mK at 1200 ◦C. The GEZ/YSZ TBCs is composed of GEZ coating, YSZ coating and NiCoCrAlYHf coating. The as-deposited GEZ/ YSZ TBCs exhibit a relatively high thermal shock life and thermal cycling life due to the Er stabilized Gd2Zr2O7, the high TEC, the feathery microstructure and the low thermal conductivity. The TGO broken is generally attributed to the TGO growth and cracks evolution within TGO layer after thermal cycling test. Furthermore, the diffusion of Ni, Cr, Co, Al and Y five elements lead to the formation of Ni-Al-Cr-Co-Y oxides. The mismatch between Ni-Al-Cr-Co-Y oxides and Al2O3 also might lead to the formation of interface instability. As a result, the element diffusion might be critical factor for cracks extension leading to the spallation and delamination failure.
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